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Volumn 44, Issue 7, 2002, Pages 1411-1423
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The use of thin layer activation in high-temperature cyclic oxidation studies
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Author keywords
Area selectivity; Chromium; Cyclic oxidation; Ion implantation; Radiotracers; Thermogravimetry; Thin layer activation; Yttrium
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Indexed keywords
CHROMIUM;
CRACK INITIATION;
ION IMPLANTATION;
THERMOGRAVIMETRIC ANALYSIS;
YTTRIUM;
THIN LAYER ACTIVATION;
OXIDATION;
CHROMIUM;
COATING;
HIGH TEMPERATURE CORROSION;
ION IMPLANTATION;
OXIDATION;
YTTRIUM;
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EID: 0036643322
PISSN: 0010938X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0010-938X(01)00150-0 Document Type: Article |
Times cited : (8)
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References (28)
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