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Volumn 44, Issue 7, 2002, Pages 1411-1423

The use of thin layer activation in high-temperature cyclic oxidation studies

Author keywords

Area selectivity; Chromium; Cyclic oxidation; Ion implantation; Radiotracers; Thermogravimetry; Thin layer activation; Yttrium

Indexed keywords

CHROMIUM; CRACK INITIATION; ION IMPLANTATION; THERMOGRAVIMETRIC ANALYSIS; YTTRIUM;

EID: 0036643322     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-938X(01)00150-0     Document Type: Article
Times cited : (8)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.