Uniqueness of multiangular measurements - Part I: An indicator of subpixel surface heterogeneity from MISR

IEEE Transactions on Geoscience and Remote Sensing

Volumn 40, Issue 7, 2002, Pages 1560-1573

  Pinty, Bernard ^b   Widlowski, Jean Luc ^b   Gobron, Nadine ^a,b   Verstraete, Michel M ^a,b   Diner, David J ^a,c  

^a IEEE

^b JOINT RESEARCH CENTRE   (Italy)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

k parameter; MISR; RPV model; Surface heterogeneity

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; GEOPHYSICAL PROSPECTING; IMAGING TECHNIQUES; RADIATION EFFECTS; SENSITIVITY ANALYSIS; SPECTROMETERS; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

MULTI-ANGLE IMAGING SPECTRORADIOMETERS (MISR); SURFACE HETEROGENEITY;

RADIOMETERS;

EID: 0036630234     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/TGRS.2002.801148     Document Type: Article

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