GEM: Performance and aging tests

IEEE Transactions on Nuclear Science

Volumn 46, Issue 3 PART 1, 1999, Pages 306-311

  Cho, H S ^a   Kadyk, J ^a   Han, S H ^a   Hong, W S ^a   Perez Mendez, V ^a   Wenzel, W ^a   Pitts, K ^b   Martin, M D ^b   Hutchins, J B ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF LOUISVILLE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; COMPUTER SIMULATION; ELECTRODES; ELECTRONIC DENSITY OF STATES; INSTRUMENT TESTING; PERFORMANCE; SYSTEMS ANALYSIS;

AGING TESTS; AVALANCHE ELECTRONS; GAS ELECTRON MULTIPLIERS; POSITIVE ION MOTION;

ELECTRON MULTIPLIERS;

EID: 0033321116     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.775534     Document Type: Article

References (9)

1. F. Sauli, "GEM: A New Concept for Electron Amplification in Gas Detector," Nucl. Instr. Meth., A 386 (1997) 531.
2. F. Sauli, "Development of High Rate MSGCs", Nucl. Phys. B 61B (1998), p. 236;
3. F. Angelini et. al., "The micro-gap chamber," Nucl. Instr. Meth. A 335 (1993) 69.
4. R. Bouclier et al., "New Observations with the Gas Electron Multiplier (GEM)," Nucl. Instr. Meth., A 396 (1997) 50.
5. Maxwell Electric Field Simulator, Ansoft Corporation, Pittsburgh, PA 15219, USA.
6. H.S. Cho et al., "Performance of Microstrip Gas Chambers with Conductive Surface Coating of Doped Amorphous Silicon Carbide (a-Si:C:H)," Nucl Instr. Meth., A 401 (1997) 81.
7. W.S. Hong et al., "Performance of a Pixel Geometry Gas Avalanche Microdetectors of 50 μm Pitch," To be presented at IEEE, Nucl. Sci. Symp., Toronto, Canada, November 9-14, 1998.
8. F. Sauli, private communication.
9. R. Bellazzini et al., "What is the Real Gas Gain of a Standard GEM?," Submitted to Elsevier Preprint, March 30, 1998.