Atomic structural analysis of a monolayer epitaxial film of hexagonal boron nitride/Ni(111) studied by LEED intensity analysis

Science Reports of the Rerearch Institutes Tohoku University Series A-Physics

Volumn 44, Issue 2, 1997, Pages 211-214

  Gamou, Yasuo ^a   Terai, Masayuki ^a   Nagashima, Ayato ^b   Oshima, Chuhei ^a  

^a WASEDA UNIVERSITY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Epitaxial film; h BN; LEED analysis; Monolayer; Rumpling structure

Indexed keywords

EID: 0000025322     PISSN: 00408808     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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