Influence of post-manufacturing residual mechanical stress and crosslinking by-products on dielectric strength of HV extruded cables

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 9, Issue 3, 2002, Pages 458-466

  Amyot, N ^a   David, E ^b   Lee, S Y ^c   Lee, I H ^c  

^a HYDRO QUÉBEC   (Canada)

^b ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

^c LG   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BYPRODUCTS; CROSSLINKING; DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; ELECTRIC INSULATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHOTOELASTICITY; RESIDUAL STRESSES;

DIELECTRIC STRENGTH; HIGH VOLTAGE EXTRUDED CABLES;

ELECTRIC CABLES;

EID: 0036613401     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2002.1007710     Document Type: Article

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