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Volumn , Issue , 2001, Pages 345-348

Influence of internal residual mechanical stresses on local dielectric strength of ehv extruded xlpe cables

Author keywords

[No Author keywords available]

Indexed keywords

CROSSLINKING; DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; ELECTRIC INSULATION; ELECTRIC POTENTIAL; POLYETHYLENES; RESIDUAL STRESSES; WEIBULL DISTRIBUTION;

EID: 0035200052     PISSN: 03622479     EISSN: None     Source Type: Journal    
DOI: 10.1109/EEIC.2001.965664     Document Type: Article
Times cited : (9)

References (8)
  • 7
    • 0006858015 scopus 로고
    • Standard test method for photoelastic measurements of birefringence and residual strains in transparent for translucent plastic materials
    • (1995) ASTM D4093-95 , pp. 549-558


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.