SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 507-510, Issue , 2002, Pages 678-682

Angle resolved X-ray photoelectron spectroscopy study of Pd/NbOx/Nb interfaces

(2) Thiam, Michel Malick a Bastl, Zdeněk a

a J HEYROVSKÝ INSTITUTE OF PHYSICAL CHEMISTRY (Czech Republic)

Author keywords

Diffusion and migration; Metallic films; Niobium; Palladium; Photoelectron spectroscopy

Indexed keywords

ADSORPTION; ANNEALING; DEPOSITION; DIFFUSION; DISSOLUTION; INTERMETALLICS; METALLIC FILMS; NIOBIUM COMPOUNDS; PALLADIUM; REDUCTION; THERMODYNAMIC STABILITY; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERMETALLIC PHASES;

PHASE INTERFACES;

EID: 0036609135 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(02)01335-3 Document Type: Conference Paper

Times cited : (9)

References (21)

1
- 0032592977
- (1999) Prog. Surf. Sci. , vol.51 , pp. 127
- Bäumer, M.¹ Freund, H.-J.²

2
- 0003395742
- John Wiley, New York
- (1994) Introduction to Surface Chemistry and Catalysis , pp. 456
- Somorjai, G.A.¹

3
- 0003999733
- John Wiley, New York
- (1992) Catalytic Chemistry , pp. 383
- Gates, B.C.¹

4
- 0003138862
- (1996) Catal. Today , vol.29 , pp. 71
- Papadakis, V.G.¹ Pliangos, C.A.² Yentekakis, I.V.³ Verykios, X.E.⁴ Vayenas, G.⁵

5
- 0001466602
- (1996) Stud. Surf. Sci. Catal. , vol.101 , pp. 345
- Praliaud, H.¹ Lemaire, A.² Massardier, J.³ Prigent, M.⁴ Mabilon, G.⁵

6
- 0001169660
- (1995) Appl. Catal. A , vol.133 , pp. 191
- Tanabe, K.¹ Okazaki, S.²

7
- 0019698734
- (1981) Phys. Status Solidi A , vol.68 , pp. 505
- Finster, J.¹ Schulze, D.²

8
- 0032473763
- (1998) Appl. Surf. Sci. , vol.126 , pp. 219
- Daccá, A.¹ Gemme, G.² Mattera, L.³ Parodi, R.⁴

9
- 0003037887
- (1995) J. Electron Spectrosc. Relat. Phenom. , vol.73 , pp. 25
- Cumpson, P.¹

10
- 0025676966
- (1990) Thin Solid Films , vol.192 , pp. 351
- King, B.R.¹ Pattel, H.C.² Gulino, D.A.³ Tatarchuk, B.J.⁴

11
- 0023366857
- (1987) Surf. Interf. Anal. , vol.10 , pp. 223
- Darlinski, A.¹ Halbritter, J.²

12
- 0003715137
- NIST Standard Reference Database 20, NIST, Gaithersburg
- (1997) NIST X-ray Photoelectron Spectroscopy Database, Ver. 2.0 , vol.20

13
- 0009575707
- to be published
- Thiam, M.M.¹ Nikolajenko, V.² Knor, Z.³

14
- 33845376944
- (1985) J. Phys. Chem. , vol.89 , pp. 2481
- Peuckert, M.J.¹

15
- 0000973963
- (1983) Phys. Rev. B , vol.27 , pp. 2179
- Hillebrecht, U.F.¹ Fuggle, J.C.² Bennett, A.P.³ Zolnierek, Z.⁴ Freiburg, Ch.⁵

16
- 5244298349
- (1991) J. Phys. Chem. , vol.95 , pp. 4196
- Rodriguez, J.A.¹ Goodman, D.W.²

17
- 0000874152
- (1999) J. Phys. Chem. B , vol.103 , pp. 6521
- Reilly, J.P.¹ Barnes, C.J.² Price, N.J.³ Bennett, R.A.⁴ Poulston, S.⁵ Stone, P.⁶ Bowker, M.⁷

18
- 0001363734
- (1993) J. Phys. Condens. Matter. , vol.5 , pp. 6581
- Pick, S.¹ Mikušik, P.²

19
- 0009565590
- in preparation
- Bastl, Z.¹ Thiam, M.M.²

20
- 0030564304
- (1996) Appl. Surf. Sci. , vol.100-101 , pp. 1
- Tougaard, S.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.