SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 507-510, Issue , 2002, Pages 175-180

Auger depth profile analysis and photoluminescence investigations of Zn1-xMgxSe alloys

(5) Bukaluk, A a Trzcinski M a Firszt, F b Legowski, S b Meczynska H b

a UNIVERSITY OF TECHNOLOGY AND LIFE SCIENCES (Poland)

b NICOLAUS COPERNICUS UNIVERSITY (Poland)

Author keywords

Alloys; Auger electron spectroscopy; Chalcogens; Photoluminescence; Semiconducting surfaces

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BAND STRUCTURE; CRYSTAL GROWTH; CRYSTALS; EXCITONS; HIGH PRESSURE EFFECTS; PHOTOLUMINESCENCE; SPECTRUM ANALYSIS; SPUTTERING; THERMAL EFFECTS; ZINC ALLOYS;

BRIDGMAN METHOD; DEEP LEVEL EMISSION BANDS; SEMICONDUCTING SURFACES;

SURFACE STRUCTURE;

EID: 0036608885 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(02)01208-6 Document Type: Conference Paper

Times cited : (14)

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