Auger electron spectroscopy sputter depth profiling technique for binary solids

Surface Science

Volumn 452, Issue 1-3, 2000, Pages 220-228

  Cao, Z X ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; DIFFUSION IN SOLIDS; INVERSE PROBLEMS; ION BOMBARDMENT; MOLYBDENUM; NICKEL; OPTIMIZATION; RADIATION; SPUTTER DEPOSITION; SURFACE STRUCTURE;

BINARY SOLIDS; ION SPUTTERING; SPUTTERING EFFECT; SURFACE CONCENTRATION;

AUGER ELECTRON SPECTROSCOPY;

EID: 0034188717     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00343-5     Document Type: Article

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