Determination of the order parameter of CuPt-B ordered GaInP 2 films by x-ray diffraction

Journal of Applied Physics

Volumn 91, Issue 11, 2002, Pages 9039-9042

  Li, J H ^a   Forrest, R L ^a   Moss, S C ^a   Zhang, Y ^b   Mascarenhas, A ^b   Bai, J ^c  

^a University of Houston   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC ORDERING; DEGREE OF ORDERING; GAINP; ORDER PARAMETER; ORDERED ALLOYS; ORDERED DOMAINS; QUANTITATIVE CHARACTERIZATION; SEMI-CONDUCTOR ALLOYS; STRUCTURAL DETAILS; X RAY SPECTRUM;

X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CERIUM ALLOYS;

EID: 0036607470     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1476971     Document Type: Article

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