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Volumn 91, Issue 11, 2002, Pages 8950-8954

Measurement of reflective liquid crystal displays

Author keywords

[No Author keywords available]

Indexed keywords

CELL CHARACTERIZATION; CELL GAP THICKNESS; CELL GAPS; DESIGN PARAMETERS; INTERNAL REFLECTORS; LIQUID CRYSTAL ON SILICON DISPLAYS; MEASUREMENT METHODS; REFLECTIVE DISPLAY; REFLECTIVE LCD; REFLECTIVE LIQUID CRYSTAL DISPLAYS; SINGLE POLARIZERS;

EID: 0036607407     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1473698     Document Type: Article
Times cited : (12)

References (24)
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    • dis DISPDP 0141-9382
    • K. H. Yang and M. Lu, Displays 20, 211 (1999). dis DISPDP 0141-9382
    • (1999) Displays , vol.20 , pp. 211
    • Yang, K.H.1    Lu, M.2
  • 9
    • 84861420034 scopus 로고
    • US Patent No. 5,239,365
    • T. Inoue, US Patent No. 5,239,365 (1993).
    • (1993)
    • Inoue, T.1
  • 11
    • 36449003857 scopus 로고
    • jaJAPIAU 0021-8979
    • A. Lien and H. Takano, J. Appl. Phys. 69, 1304 (1991). jap JAPIAU 0021-8979
    • (1991) J. Appl. Phys. , vol.69 , pp. 1304
    • Lien, A.1    Takano, H.2
  • 21
    • 84861422598 scopus 로고    scopus 로고
    • Ph.D. Thesis, Hong Kong University of Science and Technology
    • S. T. Tang, Ph.D. Thesis, Hong Kong University of Science and Technology, 2001.
    • (2001)
    • Tang, S.T.1
  • 23
    • 0030103973 scopus 로고    scopus 로고
    • apl APPLAB 0003-6951
    • S. T. Wu and C. S. Wu, Appl. Phys. Lett. 68, 1455 (1996). apl APPLAB 0003-6951
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 1455
    • Wu, S.T.1    Wu, C.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.