Two new measurement methods for determining tn structure

Liquid Crystals

Volumn 22, Issue 3, 1997, Pages 327-333

  Sumiyoshi, Ken ^a   Hatada, Yoriko ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2542603226     PISSN: 02678292     EISSN: 13665855     Source Type: Journal    
DOI: 10.1080/026782997209397     Document Type: Article

References (6)

1. Inoue, T., Japanese Patent H4-307312 (in Japanese).
2. Azzam, R. M. A., and Bashara, N. M., Ellipsometry and Polarized Light (North-Holland Personal Library).
3. Jones, R. C., 1941, J. Opt. Soc. Am., 31, 488.
4. Lien, A., 1990, J. appl. Phys., 67, 2853.
5. McIntyre, P., and Snyder, A. W., 1978, J. Opt. Soc. Am., 68, 149-157
6. Lien, A., and Takano, H., 1984, J. appl. Phys., 69, 1304.