A comparative study of two transient analysis algorithms flor lossy transmission lines with frequency-dependent data

IEEE Transactions on Advanced Packaging

Volumn 25, Issue 2, 2002, Pages 143-153

  Elfadel, Ibrahim M ^a   Huang, Hao Ming ^b   Ruehli, Albert E ^a   Dounavis, Anestis ^c   Nakhla, Michel S ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM MICROELECTRONICS   (United States)

^c CARLETON UNIVERSITY   (Canada)

Author keywords

Circuit simulation; Distributed networks; Frequency dependent parameters; High speed interconnect; Matrix rational approximation; Method of characteristics; Transient analysis; Transmission lines

Indexed keywords

BOUNDARY CONDITIONS; DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; SKIN EFFECT;

HIGH-SPEED INTERCONNECTS; LOSSY TRANSMISSION LINES;

TRANSMISSION LINE THEORY;

EID: 0036589420     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2002.803270     Document Type: Conference Paper

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