Parametric macromodels of digital I/O ports

IEEE Transactions on Advanced Packaging

Volumn 25, Issue 2, 2002, Pages 255-264

  Stievano, Igor S ^a   Maio, Ivan A ^a   Canavero, Flavio G ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Circuit modeling; Digital integrated circuits; Electromagnetic compatibility; I O ports; Macromodeling; Radial basis function models; Signal integrity; System identification

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; EQUIVALENT CIRCUITS; RADIAL BASIS FUNCTION NETWORKS; TRANSISTORS; WAVEFORM ANALYSIS;

PARAMETRIC MACROMODELS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0036589404     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2002.803260     Document Type: Conference Paper

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