Measurements of Si ion stopping in amorphous silicon

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 190, Issue 1-4, 2002, Pages 84-88

  Whitlow, Harry J ^a   Timmers, Heiko ^b   Elliman, Robert G ^b   Weijers, Tessica D M ^b   Zhang, Yanwen ^c   Uribastera, Juan ^a,b   John O'Connor, D ^d  

^a LUND INSTITUTE OF TECHNOLOGY   (Sweden)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^c UPPSALA UNIVERSITY   (Sweden)

^d UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

Energy loss; Silicon; Stopping; Time of flight

Indexed keywords

DOPPLER EFFECT; ENERGY DISSIPATION; ION BEAMS; PARTICLE DETECTORS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR DIODES; STATISTICAL METHODS;

ELASTIC RECOIL DETECTION ANALYSIS (ERDA);

AMORPHOUS SILICON;

EID: 0036569460     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01301-5     Document Type: Conference Paper

References (18)