Influence of heavy ion irradiation damage on silicon charged particle detector calibration

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 297-301

  Zhang, Yanwen ^a   Whitlow, Harry J ^b   Winzell, Thomas ^b  

^a UPPSALA UNIVERSITY   (Sweden)

^b LUND INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CALIBRATION; CHARGED PARTICLES; ELECTRON ENERGY LEVELS; ION BOMBARDMENT; LEAKAGE CURRENTS; PARTICLE DETECTORS; RADIATION DAMAGE; RADIOISOTOPES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON;

ELASTIC RECOIL DETECTION ANALYSIS; ENERGY CALIBRATION; HEAVY ION BACKSCATTERING; HEAVY ION IRRADIATION DAMAGE; SILICON CHARGED PARTICLE DETECTOR;

HEAVY IONS;

EID: 0033893717     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00928-3     Document Type: Article

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