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Volumn 190, Issue 1-4, 2002, Pages 335-338

Ion beam induced charge characterisation of a silicon microdosimeter using a heavy ion microprobe

Author keywords

IBIC; Microdosimetry; Microprobe

Indexed keywords

ARRAYS; CHARACTERIZATION; DOSIMETERS; HEAVY IONS; IMAGING TECHNIQUES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS;

EID: 0036569187     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01316-7     Document Type: Conference Paper
Times cited : (19)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.