Semiconductor microdosimetry in mixed radiation and photon fields: Present and future

Radiation Protection Dosimetry

Volumn 85, Issue 1-4, 1999, Pages 385-388

  Rosenfeld, A B ^a   Bradley, P D ^a  

^a UNIVERSITY OF WOLLONGONG   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

CALIBRATION; CONFERENCE PAPER; ELECTRONICS; FAST NEUTRON RADIATION; MICRODOSIMETRY; NEUTRON CAPTURE THERAPY; ONCOLOGY; PERSONAL MONITORING; PHOTON; PROTON RADIATION; RADIATION PROTECTION; SEMICONDUCTOR;

EID: 0032790720     PISSN: 01448420     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.rpd.a032877     Document Type: Conference Paper

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