Effect of grain size on the electrical properties of (Pb0.72La0.28)Ti0.93O3 thin films grown by pulsed laser deposition

Materials Science in Semiconductor Processing

Volumn 5, Issue 2-3, 2002, Pages 249-252

  Han, Kyoung Bo ^a   Jeon, Chang Hoon ^a   Jhon, Hee Sauk ^a   Lee, Sang Yeol ^a  

^a Yonsei University   (South Korea)

Author keywords

(Pb0.72La0.28)Ti0.93O3; Annealing; Pulsed laser deposition; Scanning electron microscopy

Indexed keywords

ANNEALING; ELECTRIC PROPERTIES; FILM GROWTH; GRAIN SIZE AND SHAPE; IN SITU PROCESSING; LEAKAGE CURRENTS; MICROSTRUCTURE; PEROVSKITE; POLARIZATION; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; THIN FILMS;

ENERGY DENSITY;

LEAD COMPOUNDS;

EID: 0036557752     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(02)00112-9     Document Type: Conference Paper

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