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Physica Status Solidi (A) Applied Research

Volumn 190, Issue 2, 2002, Pages 305-313

Parametric matter in semiconductor microcavities

(11) Saba, M a,d Ciuti, C a Kundermann, S b Staehli, J L c Deveaud, B a Bloch, J b Thierry Mieg, V c Andre R a Dang, Le Si b Bongiovanni, G c Mura, A a

a EPFL (Switzerland)

b CNRS (France)

c UNIV GRENOBLE ALPES (France)

d UNIVERSITY OF CAGLIARI (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; EXCITONS; MATHEMATICAL MODELS; OPTICAL PROPERTIES; PHOTONS;

POLARITONS; SEMICONDUCTOR MICROCAVITIES;

SEMICONDUCTOR MATERIALS;

EID: 0036544379 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/1521-396X(200204)190:2<305::AID-PSSA305>3.0.CO;2-3 Document Type: Conference Paper

Times cited : (8)

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