SCOPUS 정보 검색 플랫폼

Physica Status Solidi (A) Applied Research

Volumn 190, Issue 2, 2002, Pages 363-367

Optical characterization of semiconductor microcavities by spatially resolved imaging and resonant Rayleigh scattering

(7) Gurioli, M a Bogani, F b Wiersma, D S c Roussignol, P d Cassabois, G d Khitrova, G e Gibbs, H e

a Istituto Nazionale per la Fisica della Materia Milan (Italy)

b UNIVERSITY OF FLORENCE (Italy)

c UNIVERSITY OF FLORENCE (Italy)

d ECOLE NORMALE SUPÉRIEURE (France)

e UNIVERSITY OF ARIZONA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; MIRRORS; OPTICAL PROPERTIES; RAYLEIGH SCATTERING; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS;

BRAGG REFLECTORS; DIELECTRIC FLUCTUATIONS; SEMICONDUCTOR MICROCAVITIES; SPATIALLY RESOLVED IMAGING;

CAVITY RESONATORS;

EID: 0036544250 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/1521-396X(200204)190:2<363::AID-PSSA363>3.0.CO;2-O Document Type: Article

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.