Microscopic mechanisms behind the Al-induced crystallization of a-Ge:H films

Journal of Non-Crystalline Solids

Volumn 299-302, Issue , 2002, Pages 143-147

  Chambouleyron, Ivan ^a   Fajardo, F ^a,c   Zanatta, A R ^b  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

^c UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AMORPHOUS FILMS; CRYSTALLIZATION; HYDROGENATION; INFRARED SPECTROSCOPY; MICROSCOPIC EXAMINATION; RAMAN SPECTROSCOPY; SEMICONDUCTING GERMANIUM; SPUTTER DEPOSITION; SUBSTRATES;

METAL-INDUCED CRYSTALLIZATION (MIC);

SEMICONDUCTING FILMS;

EID: 0036540514     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)00999-1     Document Type: Article

References (12)