Imaging Ni segregation in synthetic diamond using ionoluminescence (IL) and particle induced X-ray emission (PIXE)

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 225-230

  Bettiol, A A ^a,c   Ryan, C G ^b   Jamieson, D N ^a   Prawer, S ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b CSIRO   (Australia)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Diamond; Ionoluminescence; Nickel; Nuclear microprobe; PIXE

Indexed keywords

CRYSTAL IMPURITIES; DEFECTS; IMAGE SEGMENTATION; ION BEAMS; LUMINESCENCE; NUCLEAR PHYSICS; PROBES; SPECTROSCOPIC ANALYSIS;

IONOLUMINESCENCE (IL) SPECTROSCOPY; NUCLEAR MICROPROBES;

SYNTHETIC DIAMONDS;

EID: 0035387964     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00459-1     Document Type: Conference Paper

References (14)