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Volumn 204, Issue 1-6, 2002, Pages 45-52

Complete mapping of complex reflection coefficient of a surface using a scanning homodyne multiport interferometer

Author keywords

Complex reflection coefficient; Multiport coherent optical detector; Simultaneous measurement of phase and amplitude; Surface diagnostics

Indexed keywords

DEFECTS; INTERFEROMETERS; PHASE MEASUREMENT; THIN FILMS;

EID: 0036535230     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(02)01235-X     Document Type: Article
Times cited : (8)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.