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Volumn 204, Issue 1-6, 2002, Pages 45-52
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Complete mapping of complex reflection coefficient of a surface using a scanning homodyne multiport interferometer
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Author keywords
Complex reflection coefficient; Multiport coherent optical detector; Simultaneous measurement of phase and amplitude; Surface diagnostics
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Indexed keywords
DEFECTS;
INTERFEROMETERS;
PHASE MEASUREMENT;
THIN FILMS;
MULTIPORT COHERENT OPTICAL DETECTORS;
SURFACE DIAGNOSTICS;
LIGHT REFLECTION;
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EID: 0036535230
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(02)01235-X Document Type: Article |
Times cited : (8)
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References (18)
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