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Volumn 46, Issue 4, 2002, Pages 505-512

Determination of semiconductor resistance under a contact

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; PROBES; SEMICONDUCTING FILMS; TRANSMISSION LINE THEORY;

EID: 0036533111     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(01)00286-6     Document Type: Article
Times cited : (9)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.