|
Volumn 237-239, Issue 1 4 II, 2002, Pages 1610-1614
|
Epitaxial growth of a vacancy-ordered Ga2Se3 thin film on a vicinal Si(0 0 1) substrate
|
Author keywords
A1. Reflection high energy electron diffraction; A3. Molecular beam epitaxy; B1. Gallium compound; B2. Semiconducting gallium compounds
|
Indexed keywords
HIGH ENERGY ELECTRON DIFFRACTION;
MOLECULAR BEAM EPITAXY;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SUBSTRATES;
SURFACE TREATMENT;
THERMAL EFFECTS;
THIN FILMS;
FLUX RATIO;
EPITAXIAL GROWTH;
|
EID: 0036531458
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)02353-3 Document Type: Article |
Times cited : (18)
|
References (20)
|