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Volumn 237-239, Issue 1-4 I, 2002, Pages 188-191

Cross-sectional HRTEM study of Si(5 5 12) reconstructed surface

Author keywords

A1. Computer simulation; A1. Growth models; A1. Surface structure

Indexed keywords

COMPUTER SIMULATION; DIMERS; HIGH RESOLUTION ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; ULTRAHIGH VACUUM;

EID: 0036530523     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01874-7     Document Type: Conference Paper
Times cited : (30)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.