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Volumn 237-239, Issue 1-4 I, 2002, Pages 188-191
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Cross-sectional HRTEM study of Si(5 5 12) reconstructed surface
a
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Author keywords
A1. Computer simulation; A1. Growth models; A1. Surface structure
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Indexed keywords
COMPUTER SIMULATION;
DIMERS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON;
ULTRAHIGH VACUUM;
GROWTH MODELS;
SURFACE STRUCTURE;
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EID: 0036530523
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)01874-7 Document Type: Conference Paper |
Times cited : (30)
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References (8)
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