Film thickness dependence on the electrical and optical properties of PtSi/p-Si(1 0 0) Schottky barrier detector

Materials Chemistry and Physics

Volumn 74, Issue 2, 2002, Pages 177-181

  Lyu, Yen Tang ^a   Lee, Ching Ting ^a   Horng, Gwo Ji ^b   Ho, Chia ^b   Lee, Ching Yuan ^b   Wu, Chung Sen ^b  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^b CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Electron diffraction pattern; HRTEM; Infrared; PtSi; Schottky barrier detector (SBD)

Indexed keywords

ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; HIGH RESOLUTION ELECTRON MICROSCOPY; INFRARED RADIATION; PHONONS; QUANTUM EFFICIENCY;

ELECTRICAL BARRIER HEIGHT;

PLATINUM COMPOUNDS;

EID: 0036497819     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(01)00464-3     Document Type: Article

References (14)