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Volumn 65, Issue 3, 2002, Pages 252-256
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Survey of neon and argon emission between 3800 Å and 6000 Å in the EBIT-II electron beam ion trap
a a b a |
Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
CAMERAS;
CHARGE COUPLED DEVICES;
ELECTRON BEAMS;
ELECTRON ENERGY LEVELS;
IONIZATION OF GASES;
LIGHT EMISSION;
NEON;
SPECTROGRAPHS;
SPECTRUM ANALYSIS;
ELECTRON BEAM ION TRAPS (EBIT);
ELECTRON TRAPS;
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EID: 0036496077
PISSN: 00318949
EISSN: None
Source Type: Journal
DOI: 10.1238/Physica.Regular.065a00252 Document Type: Article |
Times cited : (5)
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References (27)
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