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Volumn 65, Issue 3, 2002, Pages 252-256

Survey of neon and argon emission between 3800 Å and 6000 Å in the EBIT-II electron beam ion trap

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CAMERAS; CHARGE COUPLED DEVICES; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; IONIZATION OF GASES; LIGHT EMISSION; NEON; SPECTROGRAPHS; SPECTRUM ANALYSIS;

EID: 0036496077     PISSN: 00318949     EISSN: None     Source Type: Journal    
DOI: 10.1238/Physica.Regular.065a00252     Document Type: Article
Times cited : (5)

References (27)
  • 25
    • 0006343712 scopus 로고    scopus 로고
    • U.S. National Bureau of Standards, NSRDS-NBS 3, Section 4
    • Moore, C.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.