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Volumn 70, Issue 1 II, 1999, Pages 288-291

Implementation of a normal incidence spectrometer on an electron beam ion trap

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000248239     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149325     Document Type: Article
Times cited : (14)

References (13)
  • 4
    • 0348017938 scopus 로고
    • Atomic Processes in Plasmas
    • edited by W. L. Rowan AIP, New York
    • P. Beiersdorfer et al., in Atomic Processes in Plasmas, AIP Conf. Proc. No. 322, edited by W. L. Rowan (AIP, New York, 1995), pp. 129-140.
    • (1995) AIP Conf. Proc. No. 322 , vol.322 , pp. 129-140
    • Beiersdorfer, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.