Reliability qualification of semiconductor devices based on physics-of-failure and risk and opportunity assessment

Quality and Reliability Engineering International

Volumn 18, Issue 2, 2002, Pages 81-98

  Katz, Asaf ^a   Argov, Nitay ^b   Shapira, Alon ^b   Gershman, Israel ^c   Refaeli, Nir ^a  

^a Department of Tropical Medicine ^*  (Germany)

^b Electronic Research Department   (Israel)

^c UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

Advanced quality planning; Failure mechanisms; Failure mode effect analysis (FMEA); Physics of failure; Product tree analysis; Quality function deployment (QFD); Reliability models; Reliability qualification; Reliability tests; Risk and opportunity assessment; Semiconductor devices

Indexed keywords

DATABASE SYSTEMS; FAULT TREE ANALYSIS; QUALITY FUNCTION DEPLOYMENT; RISK ASSESSMENT; SEMICONDUCTOR DEVICES;

ADVANCED QUALITY PLANNING; FAILURE MODE EFFECT ANALYSIS (FMEA);

RELIABILITY;

EID: 0036494050     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.468     Document Type: Article

References (13)

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9. Semiconductor device reliability failure models
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12. Application-specific semiconductor device qualification monitoring
13. Failure mechanism driven reliability test methods for LSIs