Physics-of-failure guidelines for accelerated qualification of electronic systems

Quality and Reliability Engineering International

Volumn 14, Issue 6, 1998, Pages 433-447

  Upadhyayula, Kumar ^a   Dasgupta, Abhijit ^{a,b,c,d,e,f,g}  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d U S ARMY RESEARCH OFFICE   (United States)

^e ASME   (United States)

^f Society of Experimental Mechanics

^g U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

Accelerated product qualification; Accelerated wearout tests; Acceleration factor; Combined stress tests; Damage modelling; Incremental damage superposition approach; Overstress failures; Palmgren Miner's hypothesis; Physics of failure

Indexed keywords

ELECTRONIC EQUIPMENT; LIFE CYCLE; RELIABILITY; SERVICE LIFE; STRESS ANALYSIS;

ACCELERATED QUALIFICATION; ELECTRONIC SYSTEMS; PHYSICS OF FAILURE;

FAILURE ANALYSIS;

EID: 0032201927     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199811/12)14:6<433::AID-QRE224>3.0.CO;2-U     Document Type: Article

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