Direct fabrication of parallel quantum dots with an atomic force microscope

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 13, Issue 2-4, 2002, Pages 1155-1158

  Keyser, U F ^a   Paesler, M ^a   Zeitler, U ^a   Haug, R J ^a   Eberl, K ^b  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

Atomic force microscope; Double quantum dots; Transport measurements

Indexed keywords

ATOMIC FORCE MICROSCOPY; COULOMB BLOCKADE; HETEROJUNCTIONS; LITHOGRAPHY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

DOUBLE QUANTUM DOTS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0036492705     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(02)00325-9     Document Type: Article

References (16)

1. Special issue on nanometer-scale science and technology