Numerical modeling of plasma sheath phenomena in the presence of secondary electron emission

IEEE Transactions on Plasma Science

Volumn 30, Issue 1, 2002, Pages 318-326

  Jolivet, Laurent ^a   Roussel, Jean François ^a  

^a ONERA   (France)

Author keywords

Particle In Cell; Plasma; Secondary electron emission; Sheath; Two stream instability

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; IONS; PLASMA SOURCES; SECONDARY EMISSION;

TWO STREAM INSTABILITY;

PLASMA SHEATHS;

EID: 0036478131     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2002.1003876     Document Type: Article

References (17)

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8. Bounded multi-scale plasma simulation: Application to sheath problems
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10. Application of the Particle-In-Cell method for numerical simulation of sheath plasma
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12. Effects of cold electron emission on the plasma sheath
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14. Boundary conditions including sheath effects at a plasma-facing surface
15. Secondary electron emission properties of oxidized beryllium CFA cathodes