|
Volumn 478, Issue 1-2, 2002, Pages 142-146
|
The CLEO III drift chamber
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CALORIMETERS;
ELECTRIC FIELDS;
PARTICLE BEAM TRACKING;
QUALITY CONTROL;
SILICON;
STORAGE RINGS;
ELECTRON STORAGE RINGS;
SILICON VERTEX DETECTORS;
DRIFT CHAMBERS;
|
EID: 0036475324
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(01)01737-5 Document Type: Conference Paper |
Times cited : (230)
|
References (15)
|