![]() |
Volumn 33, Issue 2, 2002, Pages 249-259
|
Creep at low stresses: An evaluation of diffusion creep and Harper-Dorn creep as viable creep mechanisms
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ACTIVATION ENERGY;
COMPRESSIVE STRESS;
ELASTIC MODULI;
GRAIN BOUNDARIES;
HIGH TEMPERATURE TESTING;
RECRYSTALLIZATION (METALLURGY);
SCHEMATIC DIAGRAMS;
VECTORS;
DIFFUSION CREEP;
GRAIN BOUNDARY SLIDING;
HARPER-DORN CREEP;
CREEP TESTING;
|
EID: 0036475071
PISSN: 10735623
EISSN: None
Source Type: Journal
DOI: 10.1007/s11661-002-0087-4 Document Type: Conference Paper |
Times cited : (85)
|
References (65)
|