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Volumn 15, Issue 1, 2002, Pages 91-101

Data mining for improving a cleaning process in the semiconductor industry

Author keywords

Composite classifiers; Data mining; Laser cleaning; Machine learning

Indexed keywords

DATA MINING; DECONTAMINATION; LASER APPLICATIONS; LASER BEAMS; NEURAL NETWORKS;

EID: 0036474654     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.983448     Document Type: Article
Times cited : (92)

References (26)
  • 20
    • 0008715778 scopus 로고    scopus 로고
    • ORAMIR Semiconductor Equipment LTD, Yokneam, Israel
  • 24
    • 0032628982 scopus 로고    scopus 로고
    • An overview of manufacturing yield and reliability modeling for semiconductors products
    • Aug.
    • (1999) Proc. IEEE , vol.87 , pp. 1329-1344
    • Kuo, W.1    Kim, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.