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Volumn 12, Issue 27, 2000, Pages 5981-5990
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Structure and properties of amorphous silicon-metal alloys: II. The Si1-xTix system
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS ALLOYS;
ATOMIC PHYSICS;
BAND STRUCTURE;
MATHEMATICAL MODELS;
OPTICAL VARIABLES MEASUREMENT;
SEGREGATION (METALLOGRAPHY);
SPUTTERING;
STRUCTURE (COMPOSITION);
THIN FILMS;
X RAY ANALYSIS;
X RAY SCATTERING;
AMORPHOUS SILICON METAL ALLOYS;
METAL INSULATOR TRANSITION;
STRUCTURAL MEASUREMENT;
X RAY ABSORPTION FINE STRUCTURE;
SILICON ALLOYS;
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EID: 0034225595
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/12/27/316 Document Type: Article |
Times cited : (10)
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References (21)
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