A Novel approach to angular-resolved X-ray photoelectron spectroscopy depth-profiling

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 166, Issue , 2000, Pages 350-356

  Stanchev, A ^a   Ignatova, V ^a   Ghelev, C ^a  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ION BEAMS; ION BOMBARDMENT; OXYGEN; X RAY PHOTOELECTRON SPECTROSCOPY; YTTRIUM COMPOUNDS;

INELASTIC MEAN FREE PATHS (IMFP); ION-BEAM DEPTH PROFILING;

ZIRCONIA;

EID: 0033746974     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00783-1     Document Type: Article

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