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Volumn 374, Issue 4, 2002, Pages 619-625
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Depth profiles and resolution limits in accelerator-based solid state analysis
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Author keywords
BPT; Depth profiles reconstruction; Resolution enhancement
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Indexed keywords
COMPOSITION;
ENERGY DISSIPATION;
ION BEAMS;
PROBABILITY;
SOLID STATE ANALYSIS;
CHEMICAL ANALYSIS;
CARBON;
ELEMENT;
ACCELERATION;
ANALYSIS;
APPARATUS;
BAYES THEOREM;
CHEMICAL COMPOSITION;
CONFERENCE PAPER;
ENERGY;
SOLID STATE;
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EID: 0036460696
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s00216-002-1505-6 Document Type: Conference Paper |
Times cited : (5)
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References (10)
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