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Volumn 4931, Issue , 2002, Pages 300-305
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Thermal modeling and measurement of large high power silicon devices with asymmetric power distribution
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Author keywords
Flip chip; PA RISC; Thermal measurements; Thermal modeling
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Indexed keywords
FINITE DIFFERENCE METHOD;
FINITE ELEMENT METHOD;
FLIP CHIP DEVICES;
MATHEMATICAL MODELS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR JUNCTIONS;
TEMPERATURE DISTRIBUTION;
THERMAL EFFECTS;
ASYMMETRIC POWER DISTRIBUTION;
TEMPERATURE GRADIENTS;
THERMAL MODELING;
SEMICONDUCTOR DEVICES;
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EID: 0036453574
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (8)
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