Numerical methods to compute optical errors due to stress birefringence

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4769, Issue , 2002, Pages 34-42

  Doyle, Keith B ^a   Genberg, Victor L ^b   Michels, Gregory J ^b  

^a Optical Research Associates   (United States)

^b Sigmadyne Inc   (United States)

Author keywords

CODE V; Crystalline materials; Finite element analysis; Mechanical stress; Optical design; Polarization; SigFit; Uniaxial; Wavefront error

Indexed keywords

BIREFRINGENCE; CRYSTALLINE MATERIALS; FINITE ELEMENT METHOD; LIGHT POLARIZATION; MATRIX ALGEBRA; OPTICAL DESIGN; RAY TRACING; REFRACTIVE INDEX; STRESSES; TENSORS;

INTERFEROGRAM FILES; JONES CALCULUS; OPTICAL APERTURE; OPTICAL ERRORS; OPTOMECHANICAL ANALYSIS SOFTWARE PACKAGE; THREE DIMENSIONAL FINITE ELEMENT STRESS FIELD; WAVEFRONT ERRORS;

OPTICAL DEVICES;

EID: 0036442310     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.481188     Document Type: Conference Paper

References (4)

1. CODE V® is a product of Optical Research Associates, Pasadena, CA
2. SigFit written by Sigmadyne, Inc., Rochester, NY
3. V. Genberg, G. Michels, K. Doyle, "Making Mechanical FEA Results Useful in Optical Design", Proc. SPIE 4761, July, 2002, Seattle, WA.
4. Doyle, K. B., Hoffman, J. M., Genberg, V. L., Michels, G. J., "Stress Birefringence Modeling for Lens Design and Photonics", International Optical Design Conference, Tucson, Arizona, 2002.