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Volumn , Issue , 2002, Pages 180-182
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Stress Birefringence Modeling for Lens Design and Photonics
a b c c
c
NONE
(United States)
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Author keywords
CODE V ; finite element analysis; mechanical stress; polarization; Sigfit; stress birefringence; wavefront error
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Indexed keywords
BIREFRINGENCE;
LENSES;
OPTICAL DESIGN;
POLARIZATION;
TELECOMMUNICATION INDUSTRY;
WAVEFRONTS;
CODE V®;
FINITE ELEMENT ANALYSE;
INDUCED STRESS;
LENS DESIGNS;
MECHANICAL;
MECHANICAL STRESS;
POLARIZATION SENSITIVE;
SIGFIT;
STRESS BIREFRINGENCE;
WAVEFRONT ERRORS;
FINITE ELEMENT METHOD;
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EID: 85135901513
PISSN: None
EISSN: 21622701
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (3)
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