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Volumn , Issue , 2002, Pages 116-119
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HICUM parameter extraction methodology for a single transistor geometry
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
CURRENT DENSITY;
OPTIMIZATION;
SEMICONDUCTING SILICON COMPOUNDS;
PARAMETER EXTRACTION;
BIPOLAR TRANSISTORS;
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EID: 0036441872
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (25)
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References (10)
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