Interferometer control of optical tweezers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4778, Issue , 2002, Pages 142-149

  Decker, Arthur J ^a  

^a NASA GLENN RESEARCH CENTER   (United States)

Author keywords

Interferometry; Nanotechnology; Optical tweezers

Indexed keywords

INTERFEROMETRY; LIGHT MEASUREMENT; LIGHT MODULATION; LIGHT SCATTERING; MIRRORS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; PROCESS CONTROL;

OPTICAL TWEEZERS;

INTERFEROMETERS;

EID: 0036417185     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.473537     Document Type: Conference Paper

References (10)

1. Jih-Fen Lei, NASA/Project Plan, Nanotechnology Project, Aerospace Propulsion and Power Program (R&T Base), Nov. 8, 2000.
2. M.V. Salapaka, D.J. Chen and J.P. Cleveland, "Linearity of amplitude and phase in tapping-mode atomic force microscopy," Phys. Rev. B 61, pp. 1106-1115, 2000.
3. R. Seibel, "Manipulation of Micro Scale Particles in an Optical Trap Using Interferometry," NASA/TM in progress.
4. Hamamatsu SLMM X7550 LCD Lens-Coupled PAL-SLM Module (Parallel Aligned Liquid Crystal Spatial Light Modulator).
5. F. Gittes and C.F. Schmidt, "Interference model for back-focal-plane displacement detection in optical tweezers," Opt. Lett. 23, pp. 7-9, 1998.
6. A.J. Decker, "Self-aligning optical measurement systems," Appl. Opt. 31, pp. 4339-4340, 1992.
7. A.J. Decker and A.E. Buggele, "Automation of Some Operations of a Wind Tunnel Using Artificial Neural Networks," AIAA J. 34, pp. 421-423, 1996.
8. A.J. Decker, "Optimization of training sets for neural-net processing of characteristic patterns from vibrating solids," Optical Diagnostics for Fluids, Solids, and Combustion, Proc. SPIE, C.R. Mercer, S.S. Cha and G. Shen, eds., vol. 4448, pp. 209-217, 2001.
9. A.J. Decker, "Neural-Net Processing of Characteristic Patterns," Topics on Nondestructive Evaluation Series, Automation, Miniature Robotics and Sensors for Nondestructive Evaluation and Testing, Yoseph Bar-Cohen, Technical Editor, vol. 4, chapter 7.1, The American Society for Nondestructive Testing, Inc., 2000.
10. Y. Kobayashi, Y. Igasaki, N. Yoshida, N. Fukuchi, H. Toyoda, T. Hara, M.H. Wu, "Compact High-efficiency Electrically-addressable Phase-only Spatial Light Modulator," Diffractive/Holographic Technologies and Spatial Light Modulators VII, Proc. SPIE, I. Cindrich, S.H. Lee and R.L. Sutherland, eds., vol. 3951, pp. 158-165, 2000.