Sub-angstrom probe size in HADF-STEM at 120KV

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 14-15

  Batson, Philip ^a   Dellby, N ^b   Krivanek, O L ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b Nion Co Kirkland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036413669     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602101504     Document Type: Conference Paper

References (3)

1. N. Dellby, O.L. Krivanek, P.D. Nellist, P.E. Batson, and A.R. Lupini, J. Electron Microscopy, 50 (2001) 177.
2. Z. Yu, P.E. Batson, and J. Silcox, in Microscopy and Microanalysis, edited by G.W. Bailey, R.L. Price, E. Voelkl, and I.H. Musselman (Springer-Verlag, New York, 2002), in press.
3. E.J. Kirkland, Advanced computing in electron microscopy (Plenum Press, New York, 1998).