Electron back-scattered diffraction misorientation mapping applied to stress corrosion cracking of stainless steels

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 698-699

  Othon, M A ^a   Brewer, L N ^a   Angeliu, T M ^a   Young, L M ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036412216     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602106490     Document Type: Conference Paper

References (4)

1. L.M. Young, P.L. Andresen and T.M. Angeliu, Corrosion/01, paper 131, NACE, Houston, TX , 2001.
2. W.W. Gerberich, D.L. Davidson, and M. Kaczorowski,J. Mech. Phys. Solids Vol. 38, No. 1, pp. 87-113, 1990.
3. J. Ahmed, A.J. Wilkinson, S.G. Roberts,Journal of Microscopy Vol. 195, Pt 3, pp. 197-203, 1998.
4. A.T. Tucker, A.J. Wilkinson, et al.,Mat. Sci. and Tech., Vol. 16, pp. 427-430, 2000.