TEM observation of lattice plane expansion at the surface of a molecular crystal Br8cl8-Cu-phthalocyanine

Journal of Electron Microscopy

Volumn 51, Issue 5, 2002, Pages 303-310

  Moriguchi, Sakumi ^a   Isoda, Seiji ^a   Kobayashi, Takashi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

High resolution; HVEM; Image processing; Imperfection; Molecular crystal; Statistical test

Indexed keywords

ARTICLE;

CRYSTAL STRUCTURE; EXPANSION; MOLECULAR CRYSTALS; PHOTOGRAPHY;

CRYSTAL SURFACES; CU-PHTHALOCYANINE; HIGH RESOLUTION; HIGH-RESOLUTION IMAGES; HVEM; IMAGES PROCESSING; LATTICE-PLANE; LOW SIGNAL-TO-NOISE RATIO; MOLECULAR PLANES; TEM OBSERVATIONS;

SIGNAL TO NOISE RATIO;

EID: 0036409854     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/51.5.303     Document Type: Article

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