A tunnel crack detection and classification systems based on image processing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4664, Issue , 2002, Pages 145-152

  Liu, Zhiwei ^a   Suandi, Shahrel A ^a   Ohashi, Takeshi ^a   Ejima, Toshiaki ^a  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Classification; Support vector machine (SVM); Tunnel crack detection

Indexed keywords

ALGORITHMS; CRACKS; FEATURE EXTRACTION; GRAVITATION; IMAGE PROCESSING; INSPECTION; OBJECT RECOGNITION;

BINARY IMAGE; CLASSIFICATION SYSTEMS; SUPPORT VECTOR MACHINE; TUNNEL CRACK DETECTION;

TUNNELS;

EID: 0036406587     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.460191     Document Type: Conference Paper

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