Heavy-ion induced defects in phlogopite imaged by scanning force microscopy

Surface and Coatings Technology

Volumn 158-159, Issue , 2002, Pages 439-443

  Lang, M ^a   Glasmacher, U A ^a   Moine, B ^c   Muller C ^a   Neumann, R ^a   Wagner, G A ^b  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^c SORBONNE UNIVERSITÉ   (France)

Author keywords

Alpha recoil track dating; Artificial ion tracks; Natural radiation damage; Scanning force microscopy

Indexed keywords

ELECTRONIC EQUIPMENT; GEOLOGY; IRRADIATION; OPTICAL MICROSCOPY;

ALPHA RECOIL TRACKS;

COATING TECHNIQUES;

RADIATION;

EID: 0036396168     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(02)00270-0     Document Type: Article

References (8)